Project description:
The manufacturer is prone to damage conventional modules of monocrystalline silicon solar cell chips during the production and transportation. Serious damages may affect the power generation efficiency and service life, which will be completely reflected in operation. Therefore, EL detection is required in its production, installation and even operation and maintenance. Based on the segmentation, classification and other algorithm modules of Handdle AI and AI technology, Dongsheng Intelligent Technology proposes this EL solution to improve the detection accuracy while reducing the miss rate.
Defect types:
Hidden cracks, foggy blackening, sucker prints, graphite boat prints, concentric circles, virtual prints, dirt, black chips, hidden cracks, incomplete solder, edge blackening, black spots, cracked chips, etc.
Original picture Detection picture
AI deep learning algorithm Product standardization and low freely built threshold Continuous optimization of model
US | 2080 N. Hwy 360,Grand
Prairie, Texas 75050
Business cooperation:sales@dstekai.com
Media cooperation:pr@dstekai.com
Talent recruitment:dshr@dstekai.com